Electronics Era

  • About Us
  • Advertise with Us
  • Contact Us
  • e-Mag
  • Webinars
Header logo on website
Advertisement
Advertisement
Menu
  • News
    • Industry News
    • Product News
  • TECH ROOM
    • Sensor
    • VR / AR
    • Embedded
    • Medical Electronics
    • Industry 4.0
    • Robotic
    • Automation
    • Smart Machine
    • Component
    • Manufacturing
    • Aerospace & Defence
    • Security
    • Policy
  • Semiconductor
    • AUTOMOTIVE ELECTRONICS
      • EVs
      • HEVs
      • ADAS
      • Connected Cars
    • IoT-Internet of Things
      • Development Kit
      • IoT Design
    • Power Electronics
      • AC-DC/DC-DC Converters
      • Mosfets
      • IGBTs
      • LEDs
  • T & M
    • 5G testing
    • Oscilloscopes
    • SDN & NFV
    • RF & Wireless
  • AI/ML
  • Telecom
    • 5G/6G
  • RENEWABLES
    • Sustainability
  • Future Tech
    • Data Center
    • Cloud Computing
    • Big Data Analytics
  • Webinars
  • Editor’s Pick
    • Tech Article
    • Tech Blog
    • White Papers
    • EE-Tech Talk
    • Market Research
  • EE Awards
    • EE Awards 2025
    • EE Awards 2024
  • MORE
    • E-Mag
    • Events
    • Subscription
    • Contact Us
Home T & M

Keysight’s New Sampling Oscilloscopes Revolutionize 1.6T Transceiver Optical Testing for AI Data Centers

Nimish by Nimish
March 26, 2025
in T & M
Reading Time: 3 mins read
Keysight

Keysight oscilloscopes for 1.6T optical transceiver testing

Share on FacebookShare on TwitterShare on LinkedIn
  • Optimize test efficiency for 1.6T optical transceiver testing for R&D and manufacturing of next-generation optical interconnects for data centers AI clusters
  • Maximize data center AI network interconnect reliability with new 224 Gb/s sampling oscilloscopes
  • Minimize test setup complexity and test time with integrated clock recovery supporting data rates up to 120 GBaud
  • Scale transceiver production capacity by maximizing test asset utilization and simplifying test system configuration and automation

INDIA – Keysight Technologies, Inc.  has announced two new oscilloscopes for 1.6T optical transceiver testing: a single optical channel DCA-M and dual optical channel DCA-M Sampling Oscilloscopes. Designed to deliver the highest optical measurement sensitivity and integrated clock recovery up to 120 GBaud, the instruments specifically target the rigorous demands of 1.6T transceiver optical testing for R&D and manufacturing of next-generation optical interconnects for data centers AI clusters.

The rapid deployment of AI data center networks utilizing 1.6T optical interconnects presents significant measurement challenges due to the extreme data rates and stringent signal integrity requirements. Engineers need to characterize and validate the performance of transceivers across a broad range of challenging operating conditions, requiring precise test equipment with exceptional bandwidth, low noise, and high sensitivity. In manufacturing, automated testing must be efficient, scalable, and precise to validate critical parameters across large volumes with high throughput and yield, while ensuring performance to data center requirements and maintaining compliance with industry standards.

The new DCA-M sampling oscilloscopes are part of Keysight’s 1.6T portfolio of end-to-end solutions to address higher transmission rates required by AI and machine learning. The DCA-M sampling oscilloscopes provide high-speed optical signal analysis at up to 240 Gbps/lane, delivering:

  • Maximize measurement margin – High sensitivity, low jitter, wide precise bandwidth and leading-edge measurement science maximize measurement margin. Less than 15 µW optical channel noise and less than 90 fs of intrinsic time-based jitter preserve critical measurement margin at the very high data rates, and challenging signal conditions of 1.6T transceivers enable R&D and manufacturing engineers to meet tight specifications and ensure design reliability with greater throughput.
  • Minimize test system complexity and ensure compliance – Integrated clock recovery supports baud rates up to 120 GBd, enabling the DCA-M to recover the clock at the full data rate, as prescribed by the standards, and eliminating the need to configure and route a separate sub-rate signal for clocking.
  • Optimize production test efficiency and throughput – FlexOTO Optical Test Optimization software integrates seamlessly with DCA-M to maximize instrument utilization and test efficiency while reducing total cost-of-test. FlexOTO is built on the industry-leading FlexDCA measurement science platform ensuring the highest quality optical waveform analysis.

Osa Mok, CMO of TeraHop said: “Keysight is a long standing and reliable partner as a critical test technologies provider with high performance and quality. This new line of Keysight sampling oscilloscopes will help to accelerate 1.6 Tbps optical solutions deployment for a new generation of AI compute networking applications.”

Dr. Joachim Peerlings, Vice President of Network and Data Center Solutions at Keysight Technologies, said: “Enabling next-generation data centers and AI clusters, raises the bar for time-to-market and performance of R&D and manufacturing solutions. We are proud of our progress in supporting the industry as it advances AI infrastructure, laying the foundation for future generations to innovate in new and transformative ways.”

The DCA-M Sampling Oscilloscopes will be demonstrated in booth #1301 at the OFC 2025 conference, April 1-3, in the Moscone Center, San Francisco, California.

Resources

  • Solution Page: DCA-M solutions overview
  • Product Page: Single optical channel DCA-M
  • Product Page: Dual optical channel DCA-M
Tags: Keysight Technologiesoptical transceiver testingoscilloscopes
Nimish

Nimish

Join Our Newsletter

* indicates required
Electronics Era

Electronics Era, India's no.1 growing B2B news forum on Electronics and Cutting Edge Technology is exploring the editorial opportunity for organizations working in the Electronics Manufacturing Services(EMS) Industry.

Follow Us

Browse by Category

  • 5G testing
  • 5G/6G
  • AC-DC/DC-DC Converters
  • ADAS
  • Aerospace & Defence
  • AI/ML
  • Automation
  • AUTOMOTIVE ELECTRONICS
  • Big Data Analytics
  • Blockchain
  • Cloud Computing
  • Component
  • Connected Cars
  • Data Center
  • Editor's Desk
  • EE-Tech Talk
  • Electronics Components
  • Embedded
  • EVs
  • Future Tech
  • HEVs
  • Industry 4.0
  • Industry News
  • IoT-Internet of Things
  • LED & Lighting
  • LEDs
  • Manufacturing
  • Market Research
  • Medical Electronics
  • Mosfets
  • News
  • Oscilloscopes
  • Policy
  • Power Electronics
  • Product News
  • RENEWABLES
  • RF & Wireless
  • Robotic
  • SDN & NFV
  • Security
  • Semiconductor
  • Sensor
  • Smart Machine
  • SMT/PCB/EMS
  • Sustainability
  • T & M
  • Tech Article
  • Tech Blog
  • TECH ROOM
  • Telecom
  • Uncategorized
  • VR / AR
  • White Papers

Recent News

Lam Research

First of Its Kind: Dextro Cobot Wins Best of Sensors Award for Revolutionizing Fab Maintenance

June 27, 2025
DC-DC-Power-Converter

Microchip Expands its Space Portfolio with the SA15-28 DC-DC Power Converter and Companion SF100-28 EMI Filter

June 27, 2025
  • About Us
  • Advertise with Us
  • Contact Us

© 2022-23 TechZone Print Media | All Rights Reserved

No Result
View All Result
  • News
    • Industry News
    • Product News
  • TECH ROOM
    • Sensor
    • VR / AR
    • Embedded
    • Medical Electronics
    • Industry 4.0
    • Robotic
    • Automation
    • Smart Machine
    • Component
    • Manufacturing
    • Aerospace & Defence
    • Security
    • Policy
  • Semiconductor
    • AUTOMOTIVE ELECTRONICS
      • EVs
      • HEVs
      • ADAS
      • Connected Cars
    • IoT-Internet of Things
      • Development Kit
      • IoT Design
    • Power Electronics
      • AC-DC/DC-DC Converters
      • Mosfets
      • IGBTs
      • LEDs
  • T & M
    • 5G testing
    • Oscilloscopes
    • SDN & NFV
    • RF & Wireless
  • AI/ML
  • Telecom
    • 5G/6G
  • RENEWABLES
    • Sustainability
  • Future Tech
    • Data Center
    • Cloud Computing
    • Big Data Analytics
  • Webinars
  • Editor’s Pick
    • Tech Article
    • Tech Blog
    • White Papers
    • EE-Tech Talk
    • Market Research
  • EE Awards
    • EE Awards 2025
    • EE Awards 2024
  • MORE
    • E-Mag
    • Events
    • Subscription
    • Contact Us

© 2022-23 TechZone Print Media | All Rights Reserved

Advertisement
Advertisement