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Home News Industry News

Nearfield Instruments and Singapore’s A-STAR IME Sign Research Collaboration Agreement

Nimish by Nimish
May 21, 2025
in Industry News
Reading Time: 2 mins read
Nearfield Instruments

Nearfield Instruments is bridging the semiconductor industry’s metrology and inspection challenges with in-line, non-destructive process control nanometrology solutions for advanced 3D memory and logic devices. (Image courtesy of Nearfield Instruments)

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SINGAPORE — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies.

By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR IME’s cutting-edge semiconductor research, the partnership will accelerate the development of advanced metrology solutions that enable efficient AI chip production.

The rapid rise of AI is driving an explosive demand for compute power, presenting opportunities for innovation in semiconductor technology. As traditional semiconductor scaling reaches its limits, the industry is turning to heterogeneous integration—the advanced packaging of different types of chips into a single system—to achieve exceptional compute performance and enhanced energy efficiency. This shift introduces greater complexity in manufacturing and underscores the critical importance of process control and precision metrology to ensure production yield and efficiency.

“AI is changing everything but its success depends on compute efficiency as well as manufacturing efficiency,” said Hamed Sadeghian, CEO of Nearfield Instruments. “Nearfield enables the AI revolution by providing the metrology solutions needed to tackle the challenges of heterogeneous integration, with a specific focus on hybrid bonding. By ensuring precision and reliability, we help manufacturers scale AI chips efficiently, improve yields, and reduce energy waste. Our collaboration with A*STAR IME strengthens our ability to develop breakthrough solutions for the future of AI-driven computing.”

“A*STAR IME works closely with industry partners to translate research into impactful solutions for the global semiconductor industry. Our collaboration with Nearfield Instruments will drive innovation in metrology, to achieve the high yield and energy-efficient manufacturing of AI and high-performance computing chips,” said Terence Gan, Executive Director of A*STAR IME.

This collaboration aligns with Singapore’s continuous efforts to strengthen its semiconductor industry through strategic partnerships with global technology leaders. “This partnership highlights Singapore’s commitment to support cutting-edge semiconductor process control research, critical for the development of next generation semiconductors used in applications such as AI,” said Mr Chang Chin Nam, Senior Vice President and Head of Semiconductors, Singapore Economic Development Board. “We welcome Nearfield’s activities in Singapore and look forward to further research and supply chain collaborations within Singapore’s growing semiconductor ecosystem.”

Tags: Advance Semiconductor Metrology SolutionsNearfield InstrumentsSingapore’s A*STAR IME
Nimish

Nimish

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