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Home News Industry News

Avnet Joins Fujikura and Others at the International Microwave Symposium in June

Nimish by Nimish
June 4, 2024
in Industry News, Telecom
Reading Time: 2 mins read
Avnet at International Microwave Symposium

Avnet at International Microwave Symposium

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Avnet will deliver an industry workshop along with Fujikura, MathWorks and Rohde & Schwarz at the International Microwave Symposium. The workshop title is FPGA-Accelerated Deep Learning for 5G Channel Estimation. It will be delivered on Thursday, June 20 at 1:30p.m. local time at the event in Washington, DC.

In addition, Fujikura will be exhibiting its 5G millimeter-wave phased array antenna module (PAAM) FutureAccess™ high-power version Type-C for 5G base stations at the symposium in booth #2060.  

Fujikura will also have a live demo of a 256-element antenna module with four PAAMs arranged in a 2×2 configuration. In this demo, an ATS800B CATR benchtop antenna test system provided by Rohde & Schwarz will be used to create a far-field* in a compact environment.

The transmitting output of an antenna module composed of four PAAMs is 16 times that of a single PAAM, and the receiving sensitivity is four times that of single PAAM, greatly improving communication distance with mobile media. A major feature of our PAAM is that this transmission and reception performance can be achieved without calibration.

The Fujikura PAAM is a fully integrated module consisting of an array antenna, beamforming ICs, a frequency conversion IC and filters. The PAAM offers the highest performance in the industry and is intended for both indoor and outdoor applications such as fixed wireless access connecting a telecommunications carrier and its subscribers, high-speed mobile wireless access for mobile terminals, and trunk lines between carrier backbone networks and base stations (wireless backhaul).

*Far-field is an area where the measurement point is far enough away from the antenna that the antenna gain can be considered constant. Normally, the distance required for far-field measurements increases in proportion to the square of the antenna aperture diameter, and measurement errors increase at shorter distances.

Tags: AvnetFujikuraMathWorksRohde & Schwarz
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Nimish

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